]> http://www.4m-net.org/taxonomy/term/663/0 en http://www.4m-net.org/KnowledgeBase/papers/PID367967 <p>Al. Cvetanovic(a), An. Cvetanovic(b), M. Socek(c), D. Andijacevic(a), W. Brenner(a)<br /> a: Institute of Sensors and Actuator Systems, Vienna University of Technology, Floragasses 7/2 A-1040 Wien<br /> b: Integrated Microsystems Austria, Victor Kaplan Strasse 2, A-2700 Wiener Neustast<br /> c: Tomeckova 3, CZ-63800, Brno</p> <h3 >Abstract</h3> <p>This paper presents a concept for avoiding collisions during micro assembly processes in the camber of a Scanning Electron Microscope (SEM). Focus is the phase of approaching of a micro-gripper to the specimen holder and the phase of picking up the micro-components that are positioned on it. Although the 3D position of the gripper tips should be known exactly the current design of equipment in the SEN chamber does not allow an assesment of the position in the z-direction. This uncertainty of relative positions causes a high risk that tips of micro-crippers break if colliding with the speciment holder as the operator has no information about the distance</p> Assembly & packaging col Mon, 12 Nov 2007 16:23:32 +0000