Post-Conference Half-day Workshops

  1. “Metrology Issues in Micro-Engineering: Industrial Demands and Research Challenges”,
    Prof. Kiyoshi Takamasu, University of Tokyo
  2. “Lab-on-Chip Microsystems”, Dr Stanislas Krawczyk, CNRS, France
  3. Polymer Technology toward Nano, future technology for Europe? Martin Ganz, Battenfeld BTG Group Austria, Bertrand Fillon, CEA France

Registration fees: free for 4M NoE partners, 100 € for all other
participants.

The Workshops will provide a good overview of the current
state-of-the-art in the field and outline the main research challenges
and technology gaps that require attention.

 

Lab-on-Chip Workshop

 

Metrology Workshop

 

Polymer Technology toward Nano, future technology for Europe?