4M Knowledge base - papers

P. Lazarou (a), N.A. Aspragathos (a), E. Jung (b)

(a) Robotics Group, Department of Mechanical Engineering and Aeronautics, University of Patras, Patras T.K. 26500, Greece
(b) Chip Interconnection Technologies, Fraunhofer IZM Berlin, Germany

Abstract

Micromanipulation is a very important issue in several fields of technology (microelectronics, optoelectronics & MEMS device packaging). Current implementations do not provide both sub-micron accuracy and movement of parts over centimeter-scale to a ~100μm final alignment precision. A micropart-inside-a-liquid-droplet manipulation concept that manages to bridge the gap from meso via the micro to the sub-micron scale in a fully contained process has been previously introduced by integrating the phenomena of electrowetting, dielectrophoresis and fluidic self-assembly. In this paper, an investigation of the electric fields that drive the manipulation of the droplet and micropart during the stages of electrowettng and dielectrophoresis is presented. Information for critical factors such as electrostatic force, Maxwell stress and surface charge density distribution is provided. Their effect on the manipulation process is verified, in accordance to theory.